Dr. Taeyoung Kim (김태영;金泰永)

Biographical Sketch

Dr. Kim is a staff AI software architect with 12 years of software engineering experience plus 10 years system research experience (AI, scientific computing, EDA). Specialized on System-level optimization with using Machine Learning. At Intel, he drives pathfinding R&D of on-device AI software platform to develop AI-based system-level modeling and optimization. Until 2021, he worked channel analysis tools for signal integrity and power integrity solutions for VLSI high-speed I/O interconnect. He has authored or co-authored more than thirty papers in scientific papers and one book publication about machine learning-based dynamic resource management in 2019. Since 2020, he has worked as a standard committee of IEEE P1924.1, which recently officially standardized in IEEE. He has been an associate editor of Integration, the VLSI Journal, and a TPC of major VLSI conferences since 2017 for DAC/ISLPED/ASP-DAC.

He has received the M.S. degree in electrical engineering from University of Virginia, Charlottesville, VA, USA in 2012, and the Ph.D. degree in computer science from University of California, Riverside, CA, USA in 2017. His dissertation was titled "System-level Electromigration-Induced Dynamic Reliability Management." During his Ph.D. study, he received a best research award at ACM Ph.D. Forum at Design Automation Conference (DAC) in 2015 and a dissertation award from the University of California in 2017.

• See my latest curriculum vitae (CV)
• Academic Tree
• McCluskey_JMCstudentTree

Selected Publications

• Books

• Order at Amazon
  
  S. Tan, M. Tahoori, T. Kim, S. Wang, Z. Sun, and S. Kiamehr, "Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization," 1st ed. Springer International Publishing, 2019
  This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. Dr. Kim has been focusing on machine learning-based dynamic resource management algorithm and this book includes his full doctoral research.

• Journals/Conferences

• T. Kim, S. X.-D. Tan, C. Cook, and Z. Sun, “Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy,” Integration, the VLSI Journal, vol. 63, pp. 31–40, Sep. 2018.
• T. Kim, Z. Liu, and S. X.-D. Tan, “Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors,” Microelectronics Journal, vol. 74, pp. 106-115, Apr. 2018.
• T. Kim, Z. Sun, H. Chen, H. Wang, S. X-D. Tan, “Energy and Lifetime Optimizations for Dark Silicon Manycore Microprocessor Considering both Hard and Soft Errors,” in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), vol. 25, no. 9, pp. 2561-2574, Sept. 2017
• T. Kim, Z. Sun, C. Cook, J. Gaddipati, H. Wang, H. Chen, S. X.-D. Tan, “Dynamic Reliability Management for Near-Threshold Dark Silicon Processors”, Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Austin, TX, Nov. 2016
• T. Kim, Z. Sun, C. Cook, H. Zhao, R. Li, D.Wong, S. X.-D. Tan, “Cross-layer modeling and optimization for electromigration-induced reliability”, Proc. IEEE/ACM Design Automation Conference (DAC), Austin, TX, Jun. 2016
• T. Kim, X. Huang, H. Chen, V. Sukharev, S. X.-D. Tan, “Learning-based Dynamic Reliability Management for Dark Silicon Processor Considering EM Effects”, Proc. Design, Automation and Test in Europe (DATE), Dresden, Germany, Mar. 2016

• Theses

• T. Kim, “System-Level Electromigration-Induced Dynamic Reliability Management,”, Doctoral Dissertation, University of California, 2017
• T. Kim, “Detection and Prevention of Forward Head Posture with Body Sensor Networks,” Master's Thesis, University of Virginia, 2012

• Complete list

• See Google Scholar and Dblp

Patents

• US20220188016A1: Methods and apparatus to adapt memory channel usage on a per-user basis

Professional Activities

• [2017-Present] Associate Editor, Integration, the VLSI Journal, ELSEVIER
• [2024] Low-power, energy-efficient and thermal-aware design, Technical Program Committee (TPC), Design, Automation and Test in Europe Conference (DATE)
• [2024] AI Track, Technical Program Committee (TPC), Design Automation Conference (DAC)
• [2023] System Track, Technical Program Committee (TPC), ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED)
• [2023] AI Track, Technical Program Committee (TPC), Design Automation Conference (DAC)
• [2022] AI Track, Technical Program Committee (TPC), Design Automation Conference (DAC)
• [2022] System Track, Technical Program Committee (TPC), ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED)
• [2022] Special Session Chair, Asian and South Pacific Design Automation Conference (ASP-DAC)
• [2021] System Track, Technical Program Committee (TPC), ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED)
• [2021-Present] Program Committee, Young Excellence (WYE) Program at IEEE Solid-State Circuits Society, IEEE
• [2020-2022] Standard Committee, IEEE P1924.1 Standard Working Group, Energy Efficient Comm Hardware, IEEE
• [2017-2018] Program Committee, ACM Student Research Competition at International Conference On Computer Aided Design (ICCAD)
• [2019-Present] Reviewer, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
• [2018-Present] Reviewer, Microelectronics Journal, ELSEVIER
• [2018-Present] Reviewer, Microelectronics Reliability Journal, ELSEVIER
• [2018-Present] Reviewer, ACM Journal on Emerging Technologies in Computing Systems (JETC)
• [2017-Present] Reviewer, ACM Transactions on Embedded Computing Systems (TECS)
• [2016-Present] Reviewer, ACM Transactions on Design Automation of Electronic Systems (TODAES)
• [2015-Present] Reviewer, IEEE Transactions On Very Large Scale Integration (VLSI) Systems (TVLSI)

Awards

• Finalist at ACM Student Research Competition (SRC), International Conference on Computer-Aided Design (ICCAD), 2016
• Travel Grant Award at ACM Student Research Competition (SRC), International Conference on Computer-Aided Design (ICCAD), 2016
• Travel Grant Award at Young Faculty Workshop, Design Automation Conference (DAC), 2016
• Dissertation Award, DYP Fellowship Award, University of California, Riverside, 2016
• Travel Grant Award at ACM Student Research Competition (SRC), International Conference on Computer-Aided Design (ICCAD), 2015
• Best Research Award at ACM Ph.D. Forum, Design Automation Conference (DAC), 2015
• Travel Grant Award at ACM Ph.D. Forum, Design Automation Conference (DAC), 2015
• Travel Grant Award at ACM Student Research Competition (SRC), International Conference on Computer-Aided Design (ICCAD), 2014
• Richard Newton Fellowship Award, Design Automation Conference (DAC), 2014
• Dean’s Distinguished Fellowship Award, University of California, Riverside, 2013-2015
• In Recognition of Exceptional Presentation (2nd place), KSEA Virginia Regional Conference, 2013

Contact

• Email: tkimva \{at} gmail \{dot} com
• Phone: \{us country code} \{dash} 650 \{dash} 690 \{dash} 0092
• See Linkedin

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Last updated on Apr 12, 2021 2:50 PM